Used SEMICS Opus II #9407040 for sale

SEMICS Opus II
Manufacturer
SEMICS
Model
Opus II
ID: 9407040
Wafer prober.
SEMICS Opus II, developed by SEMICS Co. Ltd, is a professional and highly accurate integrated metrology tool for inspection and analysis of all types of surfaces. It is designed to meet the needs of both research and industrial sectors such as automotive, aerospace industries, etc. Opus II equipment comprises of two components; the main instrument and an accessory kit which contains sensor modules and accessories. The main instrument consists of a base unit to which a separate sensor module is mounted. This module contains an optical measuring cell and a variety of power amplifiers and sensors for precise measurements. It is loaded with software for controlling its operation and for data processing. SEMICS Opus II can be used for surface characterization, surface finishing, wear analysis, contamination analysis, and corrosion analysis. The surface inspection of metal and non metals, can easily be done using this system. It is capable of measuring surface features down to microscopic sizes. The high-speed implementation helps to survey large areas quickly that would otherwise require multiple test measurements. Moreover, an automatic feature recognition is available for defining surface features of interest. In order to characterize the surface, Opus II uses an array of measuring parameters, such as surface roughness, surface diffraction, surface relief, local height uniformity, local slope, wavelengths and spatial frequencies. The unit is highly accurate and offers excellent repeatability and reproducibility using the onboard optimization and analyzer software. Furthermore, SEMICS Opus II is designed for maximum flexibility and upgradability. The sensor types can easily be switched. The instrument can be fitted with a variety of optional accessories such as a real-time image broadening and smoothing feature, 3D & Mat tracing for measuring surface deformations and simulation, zoom-in capabilities for focused and restricted measurements and highly accurate thermometers for detailed temperature analysis. In conclusion, Opus II is a versatile, yet powerful and reliable machine for examining and analyzing surfaces. Its impressive array of capabilities make it an ideal choice for all types of metrological applications.
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