Used SEMICS Opus II #9407041 for sale

SEMICS Opus II is a multi-purpose, multi-channel surface analysis prober produced by SEMICS GmbH. It is designed to serve a wide range of surface analysis applications such as scanning electron microscopy, Auger electron spectroscopy, X-ray photoelectron spectroscopy, ion beam mapping and depth profiling. Opus II provides a sophisticated, user-friendly, multi-channel platform that is suited to any research or production environment. SEMICS Opus II has a modular design that allows users to add different analytical components to the platform according to their desired applications. The main components of Opus II includem a controllable gaseous airstream for surface exposures, a sample stage for accommodating different sample sizes, and multiple channels for connecting different probes. The system can be operated either in standalone form or controlled remotely. SEMICS Opus II is capable of performing high-resolution investigations of surfaces and interfaces with high precision. Utilizing three-dimensional (3D) image reconstruction technology, it is possible to acquire high-resolution images from different probes such as scanning electron microscope (SEM), ultramicrotome, and scanning tunnelling microscope (STM). This allows users to easily and quickly scan samples in 3D and analyze the data gathered. In addition to 3D imaging, Opus II has an extensive range of analytical probes to choose from. These include Auger Electron Spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), Particle Induced X-ray Emission (PIXE), Secondary Ion Mass Spectroscopy (SIMs) and many more. These probes are designed to provide users with a thorough and detailed analysis of sample surfaces. The controller of SEMICS Opus II system is an intuitive and easy-to-use software program. It enables users to configure and control the multiple analytical channels of the platform, as well as to create custom analysis protocols. The software also includes tools for interpreting and reporting the data collected. Opus II is a reliable and versatile surface analysis tool that is well-suited for any range of analytical applications. From basic surface characterization to advanced production and research applications, it provides users with consistent and reliable results of the highest quality.