Used SEMICS Opus II #9407044 for sale

SEMICS Opus II is a prober designed specifically for high-volume production and engineering development and testing of semiconductor devices. The equipment is especially well-suited for testing and measuring parametric characteristics in wafer form and is capable of delivering extremely high probing accuracy in a very cost-effective form factor. Opus II's feature list starts with its high-speed, multi-site prober, able to perform up to 8 parallel contacts simultaneously on four different sites, each able to track up to 20K data parameters for pin-level metrology. The system's sample handling unit utilizes a cartridge-based cassette which can hold up to 600 wafer wafers of sizes from 3" to 8". The prober also supports both manual and automated loading, making it well suited for production, engineering and research and development applications. SEMICS Opus II also features a fully integrated wafer handling and test station, with a high-precision measuring machine. This tool features a high-resolution large-format imaging subsystem to quickly detect test areas and allowing for accurate alignment of test sites and prober contact points. Opus II also features a 25-site stepping motor, ensuring smooth, repeatable contact and a controlled electrical load and test geometry. SEMICS Opus II is also well-suited for analyzing parametric characteristics in wafers as it features a full suite of parametric tests, such as pulsed IV testing, HFSIV Testing and parametric tolregmeasurements. The asset also supports multi-parametric measurements, giving the user a comprehensive overview of the semiconductor device performance. Opus II also features a sophisticated user-friendly GUI for easy navigation of the complex test environment and quick navigation to the desired tests and measurements. Additionally, the model offers an advanced, real-time statistical process control and a customizable set of review and statistical reports. In terms of equipment performance, SEMICS Opus II is designed for reliability and high-speed throughput of 2GHz and data transfer rates of up to 53MB/s. The device is capable of managing up to 10000 test wafers per hour when used with multiple sites and high pin-counts. Opus II is the premier prober for high-volume production and engineering development and testing of semiconductor devices. With its combination of reliable, high-speed performance and its comprehensive feature-set, SEMICS Opus II offers a cost-effective solution for quick and reliable testing of semiconductor devices.