Used SEMICS Opus II #9407046 for sale

SEMICS Opus II is an advanced prober that offers an efficient, cost-effective way to diagnose, debug and characterize IC chips. It is an important tool for engineers involved in IC chip development and manufacture. Opus II prober consists of a base machine, prober head and a smart prober card. The base machine is a high-speed, temperature-controlled computer that runs the advanced software to control the prober and manage the data collection. The prober head is designed to transfer and locate chips at every position in its field of view, and keep track of tested pins of all chips. The smart prober card allows multiple signals to be sent and sensed at any position on the prober head. SEMICS Opus II prober is designed to probe with high accuracy and repeatability. It has an XY resolution of 0.04µm and a Z resolution of 0.2µm, enabling sub-micron probing of the smallest integrated circuit interconnects. The highly automated process requires minimal setup, and is able to process multiple chips simultaneously and probe at more than 500 sites per second. The real-time feedback of Opus II prober eliminates any guesswork on probing the IC (Integrated Circuit) parameters. Its in-depth characterization and analysis capabilities provide engineers with immediate feedback on the performance of the chips. Its sophisticated built-in algorithms allow the engineer to identify any anomalies and diagnose the root cause. Furthermore, its test data collect feature provides in-depth insight into the stability of the chip, allowing early design optimization through better data quality. SEMICS Opus II prober is simple to use and is backed by excellent customer support and training. Its modular design makes it a customizable tool that can be adapted to the specific needs of semiconductor companies, saving them time and money. Overall, Opus II prober offers a reliable, convenient and cost-effective solution to test and characterize IC chips.