Used SEMICS Opus II #9407052 for sale

SEMICS Opus II is a prober for wafer testing and quality analysis. It's used in the semiconductor industry for probing and testing small devices before, during and after their manufacturing process. This provides helpful feedback regarding their production and design, supporting more accurate quality control, elimination of incorrect products and better optimization of the production process. Opus II is a highly versatile prober, capable of multi-site wafer probing and testing, as well as 4D wafer mapping with real-time temperature sensing, DC and RF measurements, and various other configuration tests and measurements. With up to 56 stages for wafer mapping, SEMICS Opus II can perform detailed analysis for each wafer position without any motion, drastically minimizing measurement time compared to traditional methods. Opus II is also equipped with advanced automation, such as automatic calibration and test program creation. The prober can connect to SEMICS inspector, a module integrated with AI technology. This allows the prober to quickly identify the quality of test results and their deviation from the desired outcomes. SEMICS Opus II is also configured for compatibility with metrology systems, allowing for a wide variety of wafer measurements such as critical dimension, data logging, and binning. Furthermore, its advanced die-to-die and pattern-to-pattern alignment capabilities are suitable for a range of measurement tasks. Opus II is equipped with an ergonomically designed human interface, offering intuitive and user-friendly operation with clear icons and graphics. Through this, the user is able to easily control and configure various components to fit the requirement of their testing. Additionally, the system is designed with manual operator override, allowing full control of the test process if needed. In short, SEMICS Opus II is a high-performance and reliable prober, suitable for multiple wafer testing and quality analysis during production. With its advanced automation, ergonomic design and compatibility with metrology software, it can be used for a wide range of tasks, providing an excellent solution for efficient wafer testing and quality control.