Used SEMICS Opus II #9407054 for sale

The Semiconductor Manufacturing (SEMICS) SEMICS Opus II is a highly advanced prober system designed to perform complete physical and electrical test operations on semiconductor devices. It is able to measure device performance characteristics such as resistance, capacitance, current, voltage, power, inductance and temperature. The prober also performs thermocouple measurements. Opus II is equipped with an ultra-fast data acquisition system and a stable, low-noise, high-stability self-calibrating platform. It is capable of measuring device parameters with extremely high accuracy, allowing for precise processing and analysis of complex device data in real-time. The prober also supports a range of large-scale device testing and characterization capabilities, including optical and nanoscale imaging, planarity testing, high-speed die definition and alignment, yield analysis, statistical process control optimization and device programming. To ensure its accuracy and reliability in performing difficult test tasks, SEMICS Opus II is equipped with several advanced performance enhancers such as close loop servo control, dynamic force calibration and temperature stabilization. A suite of software tools are also included, allowing for a range of testing tasks to be automated and user-defined test configurations to be easily programmed. The prober also features a multi-functional user interface for easy operation and programming. Finally, Opus II is also capable of supporting automated test or product-specific programming. It is capable of creating device-specific test scripts and databases, allowing for the testing and characterization of a variety of device types. The system is available in a wide range of configurations for all testing environments. Additionally, its user-friendly design and intuitive user interface ensure that it can be operated quickly and safely.