Used SEMICS Opus II #9407055 for sale

SEMICS Opus II is a reconfigurable, versatile and advanced probing and characterization equipment designed to perform precision measurements on a wide variety of samples. The system offers a comprehensive range of probing unit technologies, such as vertical scanning, contact imaging and physical metrology. The machine is equipped with a charge coupled device (CCD) and a CMOS sensor for image capture, image recognition, and resolution analysis. Other features include a dynamically adjustable stage, a rotatable X-Y-Z stage, an automated tool for object manipulation and a multiplexer for control of multiple probe tips. Opus II has a high level of accuracy for both contact and non-contact measurements. It offers a wide range of standard and customizable probing functions, including advancing profilometer, AFM, force curve sensing, shear force microscopy, electrical scanning and mechanical contact mode probing. The asset has the capability to measure a variety of physical properties including surface topography (contact and non-contact AFM), mechanical properties (force-distance curves), electrical properties (capacitance and resistivity) as well as other properties such as friction and micro-indentation. The model also provides advanced analysis capabilities, such as CoF measurement, surface roughness calculation, and statistics. It also offers a software platform for sophisticated data management and analysis, including automated data monitoring and data analysis. SEMICS Opus II is well suited for a wide range of applications, from basic research and educational purposes to process degradation evaluation and failure analysis. This equipment is ideal for laboratories that research hard surfaces and biological materials, as well as those that require contact metrology and non-destructive testing.