Used SEMICS Opus II #9407057 for sale

SEMICS Opus II is a prober designed and developed by SEMICS (Samplers and Electron Microscopy Instruments Corporation). It is mainly used for semiconductor device probing applications. Opus II prober is designed to provide precise device probing and accurate testing results. It features a large work area, an ergonomic and space-saving form factor, and an advanced software package with a large number of test algorithms. The work area in SEMICS Opus II provides ample space for device probing and testing, with a maximum of 1000 x 200 mm space for the primary device or wafer. The versatile motion stages, including a two-axis arm and probe positioning systems, provide precise device manipulation and positioning. The quick-release feature of the probe holder allows for easy and efficient replacement of probes without having to stop the test cycle. In terms of its form factor, Opus II features a small design with an ergonomic shape, making it suitable for tight locations. Its low profile also minimizes the possibility of interference and system damage. Furthermore, the USB-type port ensures secure and efficient data transfer of test results and analysis. Finally, the safety grounding system ensures personnel safety by eliminating the risk of electrostatic discharge or electrical short circuit. The software in SEMICS Opus II consists of an extensive suite of tests and analysis algorithms. It has built-in functions for testing device operations and measuring key parameters, such as electrical performance, thermal response, reliability, and noise levels. It also includes routines for the automatic loading and scanning of device files, 3D imaging and display of probe data, and graphical visualizations of testing results. In summary, Opus II is a powerful prober designed and developed for semiconductor testing applications. It features a large work area, an ergonomic design, and an advanced software package with a large variety of test and analysis algorithms. As such, it is a highly versatile prober suitable for a wide range of probing applications.