Used SEMICS Opus II #9407059 for sale

SEMICS Opus II is a high-performance, multi-function prober designed for high-throughput, high-precision probing of substrates including semiconductor, IC packaging and image sensor applications. Opus II platform offers reliable and repeatable results for a wide range of substrates, including both 3D and 100 mm wafer scale substrates. SEMICS Opus II features an inverted design, allowing for a high level of substrate accessibility and easy operation. With its patented SHM modulation control technology, Opus II prober ensures high levels of repeatability, accuracy and efficiency in substrate prodding. The prober is equipped with a variety of probes, including lateral and vertical SCM probes, MEMS probes, IC chip probes and IC package probes, providing greater flexibility when testing substrates. The prober is also compatible with common test software programs and compatible with industry standards. To ensure reliable results, SEMICS Opus II prober includes a number of built-in safety features. Its air bearing motion control system allows for smooth and precise motion delivery, eliminating the risk of accidental damage to the substrate during testing. An integrated 6-axis dynamic alignment system further enhances the accuracy and repeatability of results, while the prober's rigid frame minimizes vibration and thermal drift to improve performance. In addition, the prober features a user-friendly interface for easier access to all functions. Its intuitive displays and controls make it easy for operators to monitor, control and adjust test parameters. Opus II also includes comprehensive data capture and tracking capabilities, allowing users to quickly review and analyze results. SEMICS Opus II prober is ideal for a wide range of testing requirements, providing reliable, accurate and repeatable performance. Its robust design, built-in safety features, easy operation and comprehensive data tracking capabilities make it an ideal choice for any semiconductor testing requirements.