Used SEMICS Opus II #9407068 for sale

SEMICS Opus II is a prober developed by SEMICS that is dedicated to investigating electronic device properties. It is a high-precision, high throughput prober with a multiple-zone thermal chuck design. The prober has a number of features that make it ideal for testing wafer-level devices, such as flexibility, scalability, and accuracy. The primary benefit of Opus II is its flexibility. The prober is able to test various devices using separate contact tips, allowing for a wide range of testing capabilities. It can handle a variety of different device sizes and features, from small CSP packages to 12" wafers. Additionally, the prober has an automated, programmable tape feeder, allowing for complex testing scenarios or large testing projects. SEMICS Opus II is also highly scalable. The prober has an expandable chuck system, allowing for a wide range of multiple-zone configurations. This means that the user can easily create a testing solution for their specific process, even on the most demanding devices. Furthermore, the prober has an integrated TEMIS prober chuck monitoring system, which allows for increased accuracy and consistency in test results due to the automated monitoring of process parameters. The prober also has a number of other features that make it reliable and accurate. It has an impressive XY resolution of 10nm, as well as an XYZ positional accuracy of 0.1 microns. Additionally, it has a high-speed z-axis motion of 350 mm/second, meaning that testing can be completed quickly and with great accuracy. Overall, Opus II is a reliable, high-precision, and scalable prober that is ideal for testing electronic devices. With its programmable tape feeder, expandable chuck system, and impressive resolution and accuracy, it offers a comprehensive testing solution for any process.