Used SEMICS Opus III #293610401 for sale

SEMICS Opus III is a prober designed for advanced tests, such as wafer probing, SAW device probing, and new packaging probe testing. It is a cost-efficient and high-performance solution for in-circuit, functional and production-level tests. Opus III is a non-destructive testing platform that supports multiple SAW device packages, including T-LIC, LGA, BGA and WLCSP. It features a lightweight, modular design that makes it easy to install and configure. This prober can be used in conjunction with existing assembly stations and machines, enabling faster, more efficient probing. In addition, the versatile prober can be customized to accommodate the specific needs of any project. The prober is outfitted with an intuitive user-friendly interface, allowing for easy navigation of the different testing options. The included software enables the creation of custom tests and the storage of results, as well as the ability to analyze data collected from tests in an easy to access, organized fashion. SEMICS Opus III also boasts high test accuracy and repeatability, as well as low-noise performance. Its contact probes can reach deep into PCB and wafer designs, just like manual probing tools, providing a greater level of accuracy. In addition, the probe tips can be changed quickly and easily, making the overall testing process much faster and more efficient. In conclusion, Opus III is a dynamic prober solution that is a reliable, cost-effective and easy-to-use option for many different applications. Complex testing tasks can be done efficiently, while testing accuracy and repeatability are assured. Whether it is used in an inline or a stand-alone setting, SEMICS Opus III is a powerful and customizable probe testing tool.