Used SEMICS Opus III #293631659 for sale

SEMICS Opus III is a prober for testing semiconductor wafers and devices. It is a highly configurable system with many features, making it ideal for testing high-volume, large-scale semiconductor processes. It features a unique forward-looking data acquisition system that allows it to quickly detect errors and defects on a wafer while testing its properties. The machine is a scanning electron microscope (SEM) linked with various probes. These probes can measure electrical, optical, and other properties of samples in both real time and static measurements. Opus III is reliable, accurate, and sensitive to a variety of defect patterns. It can be used for both basic and advanced testing, ensuring that quality assurance is maintained throughout the manufacturing process. The prober can be programmed to generate wafer maps for defect analysis. It is also equipped with a particle counter for the detection and identification of various particles present on the sample surface. This helps determine the ultimate quality of the wafer and detect contaminants that may be present on the wafer. SEMICS Opus III is also capable of pattern recognition, allowing it to recognize different defect patterns present on a wafer. This feature helps to quickly detect different variations of defects, allowing the sample to be inspected quickly and accurately. Furthermore, the machine has several signal capture channels, which allow signals to be recorded in parallel, reducing the amount of time required to complete a test cycle. The capability of Opus III has been tested in numerous applications, such as device fabrication and packaging. Its performance has been consistently reliable, ensuring maximum performance and quality control in the production process. It is also compatible with many popular industry standards, including J-STD-001 (Semiconductor Devices Standard), which makes it an ideal choice for demanding testing conditions.