Used SEMICS Opus III #293641033 for sale

SEMICS Opus III is a prober designed for failure analysis, device evaluation, and process development tasks. It was developed by SEMICS to provide the capabilities required for a full suite of probing applications. Opus III prober is capable of performing a wide range of test and measurement functions such as wafer sort, wafer level test and burn-in. It features a high throughput of up to 75 wafers per hour and a low position repeatability of just 10 μm. This allows it to provide precise alignment and wafer probing in short cycle times. The equipment includes a micro-indexer motion stage with a range of up to 1000 mm in X and Y axes. This is used to pick and place the device, and to give precise movement of the probes within the designated area. The stage also uses a vision system and an auto-align mechanism to align the next device with accuracy and reliability. This helps ensure that measurements of devices can be conducted within their optimal orientation. Additionally, all the test signals are protected against noise interference, which can be harmful to accurate measurements. SEMICS Opus III's main features include a 1,000 x 700 mm probe card, with 200KV DC, a ceramic substrate placement unit, a 6-axis robot and a multiple tips handling machine. The 1,000 x 700 mm is used for probe pattern design, and the DC level is used to set the potential of the pattern on the substrate. The ceramic substrate placement tool provides for accurate chip placement, allowing for a greater range of testing and evaluation capabilities. The 6-axis robot enables robotic manipulation of the test device, and helps to ensure that the device is positioned in and removed from the test bed in a fast and efficient manner. Finally, the multiple tips handling asset provides for repeatable measurement of multiple devices within a short amount of time with minimal set-up requirements. Opus III prober provides an host of advanced features such as a customizable GUI, auto align, automation and flexible memory. The GUI is used to provide simple and easy access to all of the model's features. Auto align offers automated wafer alignment with accuracy and reliability. The equipment's automation feature provides for the automatic control of test and measurement processes. Finally, the system's flexible memory allows for storing of test data for later analysis. SEMICS Opus III is a powerful prober trusted by users for a variety of device evaluation and failure analysis tasks. It offers an impressive range of features and capabilities, designed to provide accurate and reliable data. Its features have been designed to provide optimum efficiency and speed, as well as the highest levels of precision and reliability.