Used SEMICS Opus III #293644079 for sale

SEMICS Opus III is a comprehensive prober equipment used for wafer characterization, die sorting and defect analysis applications. It is both highly reliable and accurate, offering advanced measurement capabilities for a wide range of applications, such as wafer-level characterization and evaluation, chip-level imaging, package testing, and failure and defect localization. Through its key features, Opus III provides efficient, cost-effective automation and production yield optimization. The system is composed of three main components: a prober, an analysis unit and a diagnostic tool. The prober, at the heart of the machine, is comprised of a wafer stage, a head and a stylus. The wafer stage is designed to accurately position the wafer during measurement and the probe head contains an array of probe needles that can be used to perform physical as well as electrical measurements. The stylus allows the user to precisely measure different points on the wafer. The analysis tool allows the user to configure and run automated measurements using a graphical user interface (GUI). It is used to to collect wafer level images, acquire electrical characteristics and create wafer maps for further diagnostics and defect resolution. The asset can exceptionally measure the smallest details and quickly move between the different points on the wafer, saving time and hard work. The diagnostic tool supports images or software used for offline failure analysis. It includes several features to facilitate investigation from plotting measurement data, spot checking predefined locations, to reporting. Defects that cause die failure or performance failure can be easily identified with this tool. In order to ensure high accuracy, the model operates with a very precise closed loop servo control equipment. It has precision stages with closed loop motion control and provides precise positioning of the wafer by using encoded X, Y and Z axes. The probe head is designed to provide precise electrical measurements and automatically calibrates itself. SEMICS Opus III is one of the most reliable prober systems available making it an ideal choice for semiconductor fabrication and chip testing processes. With its advanced accuracy and precision, the system can deliver efficient, cost-effective automation and production yield optimization.