Used SEMICS Opus III #293660343 for sale

The Semiconductor SEMICS Opus III Prober is a fully automated semiconductor test station designed to provide cost-effective throughput for production testing, wafer probing, and device characterization. The equipment combines cutting-edge technology and ergonomic design in order to offer maximum efficiency, accuracy, and productivity. This system even eliminates manual operations in order to improve test and probing throughput and reduce overall production costs. The Semiconductor Opus III Prober is a fully automated prober that uses three distinct components. The first is the Prober Component which enables complete automation of the testing and probing process. This component runs on an advanced robot platform and is equipped with an integrated monitor and control unit. The Prober Component is capable of performing multiple complex tests such as creating and managing networks for distributing DC power, temperature control, vacuum forming, and material transport. The Prober Component also enables a wide range of probing options such as die, memory, RF, and flip-chip tests. The second component is the Carrier Component which is used to transport wafers and integrated circuits to the Prober Component. This component includes a test sample input tray, a test sample output tray, an integrated monitor, and an operator interface machine. The Carrier Component also includes two remote robotic arms which are designed to assist in the efficient handling of wafer and sample loading and unloading processes. The third component is the Characterization Component which performs comprehensive characterization of devices such as microprocessors, digital signal processors, analog processors, and memory devices. This Component uses a comprehensive suite of software tools to evaluate the performance of the device under multiple conditions. It is also the perfect tool for operational testing and monitoring of the device's thermal and electrical characteristics. This Component is designed to deliver high levels of accuracy and repeatability in testing and analysis processes. Overall, the Semiconductor SEMICS Opus III Prober is an automated prober that meets the demanding needs of industry-standard testing and probing environments. It is equipped with the latest technologies and advanced software tools in order to provide cost-effective throughput for production testing, wafer probing, and device characterization. The tool is designed to significantly reduce time and cost associated with manual operations while still providing accurate results.