Used SEMICS Opus III #293663242 for sale

SEMICS Opus III prober is a comprehensive and sophisticated wafer testing platform that is designed to allow for the testing of various silicon wafers, including but not limited to, CZT, Silicon-on-Insulator (SOI), thick film ceramic, and polyimide substrates. The prober is based on a capacitive-coupled feedback (CCF) design, which utilizes an array of 12 electrodes to force test and yield data to be collected and analyzed. This is done by applying an electrical potential across the electrodes so that a signal can be detected whether or not a device is present underneath the probe head. The prober also comes with the software needed to conduct a comprehensive absence/presence test, along with both single device and area-based tests. Thanks to its software and unique design, the system is able to quickly and accurately detect shorts, opens, portions of partially connected devices, and even extremely small faults. It also offers optional calibration, which improves accuracy and precision when making extremely small changes to a device's configuration. Opus III is also capable of printing out images of the substrate being tested, so that engineers will not only have an accurate picture of what's going on, but they'll be able to visually inspect and study any issues that may have arisen during wafer testing. Furthermore, SEMICS Opus III is equipped with a high-vacuum prober chamber for low-leakage and repeatability wafer testing. The chamber has multiple purposes—protecting the wafer surface from contamination and damage, reducing contamination of the test head, and providing excellent sample uniformity and repeatability. For example, air samples taken from within the chamber can be used during routine testing to identify any problems with the substrate, such as micron-level contamination or mis-alignment that could result in invalid data. Additionally, the prober includes an adjustable positioner, permitting it to move both the test and probe head in both the x- and y-axis planes. The positioner also allows the user to adjust the gap distance between the test and probe head for improved accuracy and repeatability. Overall, Opus III prober is a versatile and comprehensive platform that enables effective testing and data acquisition of a variety of wafer substrates. Thanks to its unique CCF design, adjustable positioner, and specialized software, it is the ideal solution for ensuring the quality and accuracy of your substrates.