Used SEMICS Opus III #293799068 for sale

SEMICS Opus III is a prober developed by SEMICS Techology, designed for high precision vertical probing applications. The equipment features a high-precision vertical-engraved arm with an extendable rear-axis range that offers a variety of probing configurations and enhanced functionality. The assembly also allows for part rotation with a level of precision and repeatability, making it an ideal prober for wafer level 3D inspection and other precision production processes. The system includes a CMM-grade, 9-degrees-of-freedom robotic arm for increased accuracy and rapid positioning. The prober provides a vertical accuracy of 6 microns without a need for double-sided adjustment, and a settle+/- tolerance of 2 microns. In addition, a one-touch calibration and changeover function allow fast setup. The OptoLinear™ technology uses optical linear encoders that allow the machine to determine the correct position of the x- and y-axes without the need for manual adjustments. The prober also includes advanced software options, such as a dedicated inspection library. This library allows operators to quickly and easily access a variety of automated and semi-automated functions, including pattern comparison, defect identification, statistical analysis, shape measurement, edge detection, and frame deformation analysis. The unit is designed with a small footprint for increased flexibility, easy integration, and fast deployment into existing production lines. It offers a wide range of customizing options, including custom mounting brackets, adjustable stroke, load carrying capacity, custom connectors, and cables. Additionally, the machine features an open architecture for ease of integration with existing software solutions. Opus III is suitable for a variety of vertical probing solutions and offers a reliable and cost-efficient solution for reduced production costs and increased production throughput. The tool is highly versatile and provides a reliable foundation for die probing and various other precision inspection applications.