Used SEMICS Opus III #9209249 for sale

SEMICS Opus III is a prober developed by SEMICS, a semiconductor company specializing in testing and inspection equipment. The prober is an automated test and measurement equipment that is used to probe and verify electrical characteristics of wafers for failure analysis. Opus III can be used to identify and evaluate various factors that can affect the performance of an integrated circuit. The system includes an ergonomically designed probe station and a compact controller console with a large LCD touch-screen interface. It features a choice of 2D or 3D scanning, 4-channel electrical testing, and VGA or DVI visual inspection. Three independent Z-stages enable high accuracy x-y positioning and automated wafer leveling. The probe station is equipped with two XY axes and a rotary stage, along with an optional microscope for more precise inspection. SEMICS Opus III is able to measure multiple parameters such as power consumption, leakage current, sampling voltage, and timing. Its built-in Statistical Analysis software ensures accurate measurement data with its ability to record and save test results. Users can also access previouly saved data for quick comparison and quality control. The unit is capable of handling a wide variety of wafer sizes and can be customized to a specific application with its expandable test platforms. It offers a range of test fixtures to accommodate a variety of wafer sizes, making it suitable for most wafer probing applications. Additionally, its high-speed conveyor machine enables efficient and accurate sample handling. In terms of safety, the tool features an industry-standard safety asset designed to protect operators from potential safety hazards. It also has built-in fire detection and alarming systems to ensure safety. Furthermore, dual laser scanners are set up to prevent collision of the instruments against each other. Overall, Opus III prober is a highly efficient test and measurement model designed to provide users with accurate and reliable testing data. With its intuitive design and advanced features, the equipment offers a cost-effective solution for wafer probing applications.