Used SEMICS Opus III #9251172 for sale

SEMICS Opus III is a prober designed for wafer level testing. It offers users a high speed, high precision and reliable probing solution with different die sizes. Opus III is a fully automated device. It is equipped with a special tweezers like probe card that accurately contacts to the bond pads of the wafer. The probe card is made of a special alloy that prevents the wafer from being damage due to the contact. The probe card can be shifted easily to make connections with the RF and logic pads of the die. One of the features of SEMICS Opus III is that it has a high speed scan time. The scan time is adjustable, allowing users to customize the probing speed according to their need. Opus III can also manufacture test patterns for wafers in gigabytes per second. SEMICS Opus III can also detect perturbations, faults, and identify potential failures in the circuit. The user interface of Opus III is also user-friendly and intuitive. It has a touch screen LCD display that provides users with quick and easy access to its features and settings. SEMICS Opus III also comes with software that allows users to customize their testing process and make changes based on specific test results. Opus III is one of the leading probers available on the market. It provides a reliable and high quality probing solution for manufacturers who need to test their products quickly and accurately. The fast scan time of SEMICS Opus III ensures that testing can be done efficiently and quickly, without running the risk of inaccurate or wrong test results. Additionally, the user interface and customizable settings ensure that manufacturers have an easy time configuring their testing process and making changes when necessary.