Used SEMICS Opus III #9251174 for sale

SEMICS Opus III is an automated prober designed to facilitate fault isolation, device probing, and electrical testing. The equipment is based on an automated, flexible and cost-effective automated prober for high-mix semiconductor testing that enables efficient testing operations suitable for the automotive, medical and other high reliability applications. Opus III prober has the highest throughput in its class and can be configured with a range of specialized solutions suited for a wide range of probing tasks. It features integrated load board positioners with a special orientation adjustment capability, which allows multiple types of product package device probing and testing. This efficient prober system also has a steep z-axis positioning, as well as an adjustable screw unit for accurate and secure device mounting. SEMICS Opus III has a universal control machine, a testing library and software verification, which includes various functional tests appropriate for rapid and easy debugging. For example, the tool can be used to test leakage, K, L and frequency responses, resistance and capacitance of various devices. Opus III's master-slave architecture provides an efficient and flexible asset extension, supporting up to 24 test head, as well as up to eight site test set-up configurations. Equipped with a robotic arm and vacuum pickup mechanism, the model makes it possible for high-speed device gripping and probing operations. It also features an ergonomic design for reliable, comfortable and easy operation and maintenance. Moreover, the equipment is equipped with a range of integrated tools like probes, instrumentation modules, monitors and software packages for accurate fault isolation and board testing. It is also integrated with production-ready, high-performance tool management systems for reliable communications. SEMICS Opus III provides an efficient, cost-effective solution for semiconductor testing applications. With its advanced control system, motion control solutions and integrated software solutions, it ensures better fault isolation and device testing capabilities. The solution further enables production processes to be faster and more reliable.