Used SEMICS Opus III #9254913 for sale

SEMICS Opus III is an advanced, highly accurate, automated prober designed specifically for semiconductor wafer probing. Its features include a robust, high-speed probing algorithm that allows for precision and quick measurement, an advanced metrology suite to ensure accuracy of results, automated data analysis functions, and an intuitive graphical user interface to maximize ease of use. The integrated wafer handling system has been designed to support standard sizes and types of semiconductor wafers as well as special wafers including 3-in, 5-in and SMD substrates. It can probe up to four sites per wafer, depending on the test geometry, and offers a wide selection of probing accessories. The design also includes a rigid frame structure for precise alignment of the wafer chuck and prober head, as well as active vibration dampening system. Opus III incorporates an advanced metrology suite, which includes a full-facet measurement system to ensure accurate and efficient data acquisition, and an integrated digital image viewer for fast image processing and data analysis. Its data analysis functions also allow for the correlation of all measurement results between different sites. The prober's intuitive graphical user interface simplifies setup and operation, allowing for easy customization of test parameters. It also allows users to monitor the progress of tests and quickly confirm measurement results. An embedded program allows for the saving of test configuration settings and probe patterns, and it also provides continuous on-screen guidance for users. SEMICS Opus III has been designed and built according to the highest quality standards, and is well suited for demanding production environments. Its high throughput and accuracy as well as broad range of features make it an excellent choice for production and testing of semiconductor devices.