Used SEMICS Opus III #9276658 for sale

SEMICS Opus III is a state-of-the-art prober from SEMICS International Corporation that offers unparalleled performance in electrical/thermal testing. Opus III features the dual-isolated high voltage/high current contact modules to ensure efficient testing of modern semiconductor devices. This technology also prevents any issues of tip-breakage and overheating that may arise from high voltage/high current contact probing of sensitive devices. The integrated motorized optical microscope allows for a wide range of semiconductor defect analysis, such as extreme close-up views that can be easily achieved with its 5-axis movement. This optic can be used for both macro and micro imaging, as well as for radial and vertical zoom. Additionally, the prober includes a large variety of in-situ probes for testing a wide range of semiconductor device characteristics, such as current and voltage, inductance, resistance, capacitance, and more. SEMICS Opus III includes an entirely computerized architecture for fast and efficient board loading and testing. The unit is programmed through a 15'' color touchscreen display along with computer-controlled probes. Utilizing the available 4GHz single-cluster control system, multiple board test sequences can be run simultaneously. This ability to quickly test multiple boards ensures a high throughput of test samples without compromising accuracy. In addition to the basic prober features, Opus III also includes a host of other functions. An integrated bus analyzer allows for automated analysis of up to 8 buses simultaneously, and session recording for replaying various combinations of tests for statistical analysis and improved board diagnostics. The advanced high-speed vision-based probe placement system and its proprietary technique of board part alignment enable the automated placement of probes quicker than traditional manual probing methods. To ensure the highest possible accuracy in measurements, the unit is constantly temperature-compensated in order to reduce any self-induced errors. Also, SEMICS Opus III allows for multiple boards to be tested side-by-side, so measurements of identical boards can be performed and compared for further accuracy. In addition, the innovative algorithm of the prober's auto-compensation feature eliminates any discrepancies in measurements due to external factors. Opus III is a powerful, precision prober designed to meet the most demanding requirements for board analysis and testing. With its wide range of functions and enhanced performance features, SEMICS Opus III is ideal for examining and testing the most intricate semiconductor boards and devices.