Used SEMICS Opus III #9378095 for sale

SEMICS Opus III is a professional probing system designed for the measurement and analysis of semiconductor devices. It provides a comprehensive and versatile solution for all measuring and testing tasks in semiconductor production. Opus III is equipped with two high-performance multi-channel microscope imaging systems with a maximum resolution of up to 45 µm, allowing for full 3D imaging capabilities of the device under test. The probe head has an adjustable X/Y positioner, adjustable Z stage and a vacuum chuck for handling small samples. The flexible optical alignment and focusing mechanisms offer the highest precision and accuracy for fast sample manipulation and inspection. SEMICS Opus III features a wide selection of high-performance probing modules with various options for different probing and data acquisition strategies. The most popular are thermal, electrical, and mechanical probing. The thermal probing module is a powerful tool to measure temperature profiles of a device under test. The electrical probing module offers a range of voltage and current testing functions in order to inspect the quality of the device. The mechanical probing module is capable of delivering high-precision data measurements for measuring resistive and non-resistive properties of a device. Opus III also features a wide range of analysis tools, including image processing, thermal and electrical data analysis, and mechanical data investigation. The user-friendly graphical software allows for easy navigation through the extensive menus and help files. The system is equipped with an open architecture, allowing for integration with other existing software packages and tools. Furthermore, the system can be connected to external signal sources such as sources of temperature or voltage for more complex measurements. The high functionality of SEMICS Opus III makes it a reliable and powerful solution for quickly and accurately inspecting and analyzing semiconductor devices.