Used SEMICS Opus III #9393617 for sale

SEMICS Opus III is a specialized type of probing process that is highly sought after by those seeking accurate and reliable results. It is a technique used by various organizations to analyze the grain and structure of a sample to determine its physical properties. Specifically, Opus III is a 3-dimensional electron microscopy-assisted probe technique. It employs a specifically designed SEM probe equipment with a high resolution CCD camera that maps the 3-dimensional surface of a sample. The highly precise probe is composed of a multilens objective system, a scanning electron microscope column, and various other components. This unit is capable of achieving a resolution of 3 nanometers, significantly improving the resolution and accuracy of complex analysis. In operation, SEMICS machine first scans the surface of the sample in three dimensions to capture an image of the physical structure. This digital scan is then analyzed for various frequencies and patterns, which can give insight into the physical makeup of the specified sample. This type of analysis can be used to determine material properties such as elasticity, tensile strength, thermal conductivity, electrical conductivity, and other physical properties. The tool also offers a unique, "X-ray-like" form of analysis, allowing for the study of internal features of the sample that may otherwise be hard to observe. SEMICS Opus III is unique in its ability to probe a wide range of samples, from conductive samples such as metals, to non-conductive samples like plastics and polymers. It offers high resolution imaging, with precise and accurate imaging results, and offers information about a sample that is impossible to be gathered through any other means. Thanks to its ability to scan in three dimensions, it can even be used to detect defects in the microstructure of the original sample. Furthermore, the results can be very detailed, providing highly comprehensive information on the physical makeup and structure of a material sample. Opus III is a highly versatile, powerful technique that has been successfully employed in a wide array of industries in order to accurately study materials and components. The nanometer resolution is particularly beneficial in probing delicate samples such as semiconductors, nanomaterials, and other high-precision particles. The technique's broad applicability and reliable accuracy make it a widely accepted option for materials analysis.