Used SEMICS Opus III #9412264 for sale

SEMICS Opus III is a fully automated prober for performing a variety of small-scale electrical tests on semiconductor wafers and devices. Typically, it is used for burn-in and functional testing of digital, analog and mixed-signal ICs. The system features a unique patented multi-point probe technology that ensures accurate and repeatable contact with the signal pads on the device under test. Its state-of-the-art motion control system is capable of probing multiple test sites on device configurations ranging from single-device probes to full wafer arrays. Opus III has a 32-bit Pentium-based processor and a Windows 7-based system platform. It is equipped with two optical cameras, two manual probing stations, a 8-port electronic multiplexer, and up to 16 needle probes that can be installed on a wafer probe card. The prober supports a complete set of electrical measurement tools such as short/open tests, parametric tests, switching accuracy tests, ESD tests, and a VCD/NCD automated ability testing. The multiplexer and needle probes enable high-speed fully automated scanning of hundreds of thousands of test points. The prober also features a unique multi-language user interface that provides users with the ability to program and customize their tests with a simple-to-use graphic interface. It supports the use of Microsoft Visual Basic for Applications for custom programming of user-defined scripts and macros. SEMICS Opus III is an advanced testing solution that simplifies the process of probing, evaluating, characterizing and debugging integrated circuits. With its cutting-edge robotic technology and powerful user interface, it gives engineers the flexibility and ease needed to accurately measure, simulate and examine semiconductor products quickly and efficiently. It is used in a wide array of industries, including automotive, aerospace and telecommunications. Opus III is a reliable and economical tool for automated IC testing and evaluation.