Used SEMICS Opus #9228262 for sale

SEMICS Opus is a state-of-the-art prober for semiconductor device characterization and measurement. It is designed for characterizing devices on a variety of substrates, including silicon-on-insulator (SOI), silicon, and gallium-arsenide (GaAs). Utilizing advanced electrical probing technology, Opus provides precise DC and AC parameter extraction for device characterization and testing. SEMICS Opus offers unparalleled optical-level measurement accuracy and is fully compatible with most popular calibration packages. The precision tool is uniquely capable of capturing transient or dynamic changes in voltage and current responses down to the sub-nanosecond, allowing for industry-leading accuracy in device measurements. Opus provides an automated electrical probing and parameter extraction equipment, eliminating the need for manual prober operation. The system utilizes three independently controllable axes that should be configured to match the substrate in use (e.g., contact pitch, diameter, etc.). Probes are mounted on contact holders, which allow users to get the most out of their probe session. The probe unit also comes with an integrated thermally-controlled sub-stage, which significantly reduces the risk of thermal-induced artifacts during testing. The automated prober is designed to reduce prober setup times by incorporating high-throughput features into the tool. These features include site-to-site interconnectivity, automated nanometer-level alignment of contact tips with devices, automated device positioning, and automated signal routing. These features allow users to minimize setup time and maximize tool utilization. SEMICS Opus boasts an advanced electrical measurement machine. It allows users to measure both DC and AC measurements with a broad range of resistance, capacitance, power, and reactance measurements. These measurement parameters are ideal for both characterization and testing of device parameters. The robust tool also incorporates advanced safety features to ensure that all experiments are conducted in compliance with industry standards. The safety features include a variety of tools to ensure that the precision and accuracy of the measurement is maintained, including an integrated shield tool, a protection asset, and a fault detection model. In conclusion, Opus prober provides an automated tool for fast and reliable device characterization and testing. Utilizing advanced electrical probing technology and high-speed nanometer-level alignment, the tool offers precision and accuracy for a broad range of measurements. With its reliable safety equipment, it provides industry-leading reliability and usability.