Used SEMIPROBE SA-6 #9241340 for sale

SEMIPROBE SA-6 prober is a versatile and powerful wafer probing solution capable of handling a wide variety of chips and wafers. It is designed to maximize test yield by accurately positioning and mapping each die with precision. SA-6 features a high-precision single-vacuum chuck and fully automated die plate scanning that eliminate manual alignment time. This prober provides reliable and repeatable results with low die-to-die variation. It offers a variety of probe cards for different applications. SEMIPROBE SA-6 prober consists of a base unit, a die scanning platform and a probe card. The base unit includes a powerful digital signal processor (DSP) to provide precise wafer indexing, and a microprocessor-controlled z-axis for precise wafer-to-probe card mapping. The die scanning platform is capable of scanning up to 500mm and can accommodate a variety of die shapes, including flat, square, rectangular and circular. It allows precision alignment of each die on the platform for consistent test results. The probe card in SA-6 prober is designed to provide accurate and repeatable measurements with high operating speeds. It is calibrated for optimal performance, and features an auto-levelling system for repeatable and consistent measurements. It is also equipped with a wide selection of manual or automatic test head adapters for different chip sizes or test structures. In addition to its precision probe card capabilities, SEMIPROBE SA-6 prober offers a host of other features to improve test quality. These include built-in force control functions that eliminate alignment inaccuracies caused by tilt or skewing. It also features adjustable dose-and-fire intervals to reduce test-to-test variation. Furthermore, an integrated flatness correction system allows precise measurements across the entire patterned wafer. SA-6 prober is designed to provide reliable and repeatable results even in the most challenging test environment. It features a proprietary self-learning algorithm that optimizes performance over time. Its fail-safe technology is designed to detect and eliminate probe card misalignments or short circuits, ensuring reliable measurement results. Additionally, its integrated logging and diagnostic software provides a comprehensive overview of the test results.