Used SENSARRAY 1501A-8-0608 #9144365 for sale

SENSARRAY 1501A-8-0608 prober is a high-precision prober designed for a range of advanced semiconductor device testing and probing applications. This versatile equipment is capable of testing a wide variety of substrates, including wafers, lead frames, or integrated circuits (ICs). The prober's core capability is its high-resolution, 8-channel digital flip probe head. This head is designed for testing advanced device architectures from 0.065mm down to the sub-micron level. The flip probe head can be enabled to flip and capture device current or voltage characteristics under varying environmental conditions. The chip-level probing capability of 1501A-8-0608 enables advanced characterization and as well as high-speed testing of semiconductor components. The high-resolution sensor array head also features temperature control ranging from -35°C to +150°C. This range allows accurate temperature-dependent device characteristics to be measured, enabling the operator to increase the probel accuracy and yield on increasingly complex devices. The temperature control also allows the probing system to operate reliably over a wide temperature range, ensuring the device falls in its specified limit range. The prober is also offered with a custom 40-position chuck, allowing for simultaneous testing of multiple samples with different test sequences. It also allows for quick and reliable replacement or repair of the unit's probes and the chuck. The prober has a 0.7mm to 1.5mm lift stroke for repeatable and accurate imaging over a wide range of heights. The machine's lift stroke also improves operator convenience by reducing the number of times the substrate has to be picked during an operation. This reduces any surface contamination, increases the overall throughput and yield of the process. SENSARRAY 1501A-8-0608 prober is designed for high volume production and provides support for automated testing of multiple substrates. Its high-precision and repeatable performance is ideal for automated test systems, as well as for high accuracy and yield applications in R&D environments.