Used SIGNATONE 1160 #293774942 for sale

SIGNATONE 1160 prober is a sophisticated and versatile tool designed for semiconductor testing and characterization. With advanced features and precision engineering, 1160 offers researchers and engineers a high level of control and reliability in probing applications. This prober is widely used in semiconductor labs, universities, and research institutions for a variety of applications such as wafer probing, device characterization, failure analysis, and process development. One of the key features of SIGNATONE 1160 prober is its precision linear motion control equipment. This system allows for accurate positioning of probes on the test sample, ensuring repeatable and reliable measurements. The prober is equipped with high-resolution stepper motors that provide smooth and precise movement in both the X and Y directions. This level of control is essential for probing small pads and features on semiconductor devices with nanometer-scale precision. 1160 prober also features a robust chuck design that provides excellent stability and flatness for wafer testing. The chuck is designed to accommodate various sizes of wafers, making it versatile for testing different types of semiconductor devices. The chuck can be easily replaced or upgraded to accommodate special requirements or different types of samples. In addition to its precise motion control and chuck design, SIGNATONE 1160 prober offers various probing configurations to meet different testing needs. The prober can be configured with multiple probes for simultaneous testing of multiple test points or devices on a sample. This feature is particularly useful for high-throughput testing or parallel measurements. 1160 prober is also equipped with a high-resolution microscope unit for visual inspection and alignment of probes on the sample. The microscope provides clear and magnified images of the test sample, allowing users to accurately position the probes on desired test points. This feature is essential for probing small and delicate features on semiconductor devices and ensures accurate and repeatable measurements. Furthermore, SIGNATONE 1160 prober is compatible with a wide range of probe cards and accessories, allowing users to customize the setup for specific testing requirements. The prober can be easily integrated with external measurement equipment such as oscilloscopes, spectrum analyzers, and parametric analyzers for comprehensive device characterization. Overall, 1160 prober is a reliable and versatile tool for semiconductor testing and characterization. With its precision motion control, robust chuck design, multiple probing configurations, and microscope machine, the prober offers researchers and engineers the flexibility and accuracy needed for advanced semiconductor testing applications. Whether for wafer probing, device characterization, failure analysis, or process development, SIGNATONE 1160 prober is a valuable tool for semiconductor research and development.