Used SIGNATONE CheckMate CM-300 #9223440 for sale

Manufacturer
SIGNATONE
Model
CheckMate CM-300
ID: 9223440
Prober.
SIGNATONE CheckMate CM-300 is a top-of-the-line, semiconductor prober that can be used for various semiconductor test and measurement applications. It is a contact-based, fine pitch probing equipment, which uses a variety of cutting-edge probe technologies to accurately contact even fine pitch devices for the most precise probing, probing efficiency and lowest possible electrical noise. The system contains a scanning head, a controller, a high-precision motion unit, a motorized chuck, a contact detection machine and a computer-controlled test interface. The scanning head has a non-contact eddy-current based optical sensing tool for precise probing, which uses a modulated light signal that is reflected from the sample to accurately detect when contact is made. The scanning head is also able to detect the level of force (x, y and z) applied during contact and is able to make minor adjustments to ensure a consistent and accurate probing result. The controller contains sophisticated software for prober control and data acquisition, and is designed for repeatable and accurate probing. The high-precision motion asset and motorized chuck enable the model to probe a variety of device sizes and configurations with high accuracy. The motion equipment is able to perform coordinate conversions, coordinate comparisons and coordinate position adjustments with very high precision. The contact detection system is used to detect contact between the probe and the sample and is capable of adjusting the probe-tapping operation in the vertical and horizontal directions. The unit is also programmed with a wide range of test parameters that can be used to control the probing operation and to make sure that every sample gets a uniform and consistent probing result. The computer-controlled test interface allows for complete control of the machine over a wide range of test operations, including device characterization, probing speed and position, force control, de-bouncing and end of scan detection. The overall result is a prober that is capable of providing excellent probing accuracy and testing efficiency.
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