Used SIGNATONE CM100 #9169488 for sale

SIGNATONE CM100 is a prober designed to meet the high performance requirements of wafer probe testing applications. With the highest level of accuracy and precision, CM100 helps probe cards test more quickly, deliver higher yields, and reduce overall cost. The key features of SIGNATONE CM100 include advanced signal detection and integrated control systems. Using the integrated signal detection, the prober is able to detect signals and adjust accordingly to mitigate inter-die interference, enabling high-quality testing of up to 192 devices. For integrated control, CM100 features automatic wafer alignment and precise contact variables. This reduces any misalignment errors, aligning the wafers for the most accurate and precise testing. Additionally, SIGNATONE CM100 features a wafer presentation of up to eight standard 200mm wafers, and can simultaneously handle multiple small die sizes. CM100 also features a high-quality touch-down and down-force system. This helps maximize capacitor test accuracy with multiple contact positions, reducing idle time, and enabling high-speed testing. SIGNATONE CM100 is also able to handle up to three (3) wafer stacks, and up to two (2) probe cards, allowing for fast and efficient testing cycles. CM100 is equipped with an advanced vision system, which allows quick wafer loading and deposition. An embedded MEMS accelerometer helps to detect any disturbances in the prober environment, which helps to maintain thermal and mechanical stability—essential for accurate and consistent testing results. Furthermore, SIGNATONE CM100's CMP pad detection allows for an extended pad lifetime with optimized measurement accuracy and repeatability. CM100 is designed to meet stringent ECC60, ECC90 and ESD standards, and has an excellent noise performance, allowing for accurate and reliable testing. Furthermore, SIGNATONE CM100 is sophisticated enough to be integrated into automated production lines, which can be tailored to meet specific production needs. CM100 is a high-performance prober, designed to provide the highest level of accuracy and precision needed for wafer probe testing. Featuring advanced signal detection, integrated control systems, a wafer presentation of up to eight standard 200mm wafers, and automatic wafer alignment and precise contact variables, SIGNATONE CM100 has become a reliable solution for wafer probe testing. With its ability to handle multiple small die sizes, advanced vision system, and MEMS accelerometer, CM100 sets the standard for superior wafer probe testing.