Used SIGNATONE CM100 #9210080 for sale

SIGNATONE CM100 is an industrial prober equipment designed for precise, accurate testing and diagnostics of semiconductor circuits. It is a high-end production system ideally suited for seeking out and troubleshooting yield-limiting variables in semiconductor devices. It utilizes a highly sensitive C-MOS probe to take non-scanning measurements across a variety of technologies including MEMS, RF, mixed-signal, and linear devices. The unit features true dynamic probing, a user-friendly deck layout, reliable machine management, and rapid results. The heart of CM100 is its C-MOS probe. Its C-MOS sensing technology is a specialized form of electrostatic actuation-based sensing which can detect capacitance changes as small as 0.1 femtofarads. This allows for greater accuracy and precision in taking physical measurements, greatly reducing the chances of errors and yielding faster, more definitive results. The dynamic probing capabilities of SIGNATONE CM100 allow for rapid sweeps of an entire device rather than simply taking one measurement at a set point or just scanning one side of a device. The user interface of CM100 is highly intuitive and easy to use. It features a large multi-color LCD display, keyboard, and overhead control pendant which simplifies operation and allows users to quickly adjust probing parameters or trace pins as needed. The deck layout is well organized and features an ergonomic design that keeps wires and cables out of the way of active probes. There is an LED that can be used to identify and localize any probe failures. The tool also includes robust asset management functionality. It supports up to five user defined environments with the ability to save and recall certain settings or configurations. This enables users to customize their probe settings for different applications or devices. In addition, the model uses a modular architecture for modular upgrades or replacements, ensuring the highest degree of time and effort efficiency. Overall, SIGNATONE CM100 is an advanced prober equipment designed for high-precision and high-throughput testing of semiconductor circuits. With its C-MOS sensing technology and dynamic probing capabilities, it enables users to get the data they need faster and with greater accuracy. The user-friendly interface and modular architecture make it easy to operate and maintain, with minimal downtime required. It is an invaluable device for helping identify and diagnose yield-limiting variables and optimizing semiconductor device performance.