Used SIGNATONE S-250-5 #38058 for sale
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ID: 38058
Submicron analytical probe
Bausch & Lomb microzoom II
(2) Eye pieces are 10x
(3) Objective lenses are 2.25x, 8x and 25x
Lamp housing:
X Y Z Stage adjustment
(5) Probe holders
Currently de-installed.
SIGNATONE S-250-5 is a full-featured prober that serves a variety of testing, research and manufacturing functions. Designed with the latest in precision technology, S-250-5 is a reliable testing solution for a range of applications. The prober is equipped with a range of capabilities, including automatic test speeds and force control, multiple probe types and dynamic tunneling setup. It also supports full-range wafer probing, ranging from 0.7mm to 200mm in diameter. This allows users to accurately test die and pads of virtually any size. SIGNATONE S-250-5 also provides a compact design and lightweight construction. Supporting up to three optical microscopes and four probe cards, the prober features a space-saving design that helps labs and manufacturing plants maximize their work area efficiency. In addition, the vertical configuration contributes to a more ergonomic workspace for personnel. The prober is precision engineered to reduce wafer pierces, and achieve high probe accuracy. With its special dual-stiffness suspension mechanism and internal cable management system, S-250-5 is designed to maximize accuracy and reduce vibrations and noise to a minimum. By utilizing the advanced probe monitoring capabilities and auto-leveling functions, the prober can generate detailed and accurate diagnostics in even the harshest conditions. Furthermore, the prober has a user-friendly GUI (Graphical User Interface) with a few clicks. The intuitive interface helps users quickly adjust their die-probe setup and review data. As a result, they will have an easier time configuring, setting up and performing tests. SIGNATONE S-250-5 is an efficient, powerful and versatile prober that can handle any application. Its robust capabilities and user-friendly experience make it an ideal choice for wafer testing, rework and troubleshooting applications. It is well suited for production, lab and research environments.
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