Used SIGNATONE S-250-5 #9145615 for sale

SIGNATONE S-250-5 is a full-featured, multi-function prober that is designed to enable capacitance measurements up to 100 GHz with exceptional accuracy. It is a fully integrated, high-performance equipment that offers an ideal solution for probing high-end semiconductor devices and other components in a wide range of applications. S-250-5 enables ultra-fast probing with its 500 MHz repeatability, 5 ns turn-around time, and high accuracy performance - yielding measurements with up to 0.1 picofarad precision and 0.01 nanosecond probing resolution. The system is suitable for both manual and automated operation, making it suitable for in-situ failure analysis and production test environments. SIGNATONE S-250-5 utilizes a patented design with dual-axis galvanometric scanning to provide optimized resolution and accuracy. Embedded high-voltage and temperature-sensing features enhance performance, providing clean, stable signals for accurately measuring device characteristics. Additionally, the advanced beam-interlock unit and high-resolution video camera enable the user to precisely and accurately observe the test site. Interface capabilities of S-250-5 are tailored for easy integration with existing technology. It is compatible with a variety of automated test systems and is available in both stand-alone and modular configurations. Standard software solutions include PC-based software for applications such as scripting, control, automation, data acquisition, and analysis. To meet the challenging requirements of high-speed, precise accuracy applications, SIGNATONE S-250-5 is equipped with a sophisticated, intelligent feedback machine for proactive control and optimization of column excitation and beam trajectory, enabling the tool to deliver exceptional repeatable data. The diagnostics and maintenance features streamline troubleshooting and service, maximising asset uptime. S-250-5 is a reliable and user-friendly solution that provides the performance, accuracy, and flexibility required for demanding production and laboratory probing applications. It is suited for a variety of industrial applications, including failure analysis and production test, and it is ideal for device characterization and validation.