Used SIGNATONE S-250-6 #9177414 for sale

SIGNATONE S-250-6 is a comprehensive semi-automated prober that offers maximum testing efficiency and capability for semiconductor wafers, MEMS devices, MEMS devices, and IC devices. S-250-6 is capable of testing up to two wafers simultaneously, with a maximum prober support of 8″ wafers. The prober is constructed from a compact and dynamic frame, providing maximum stability and accuracy for intricate testing procedures. SIGNATONE S-250-6 is equipped with an advanced CCD camera system for automated alignment and testing, as well as a wafer chuck that is capable of testing single and double side of the wafer. In addition to the wafer chuck, the prober is also loaded with high precision needle protech tips to facilitate accurate testing and probing with minimal distortion. The prober is also equipped with a high speed Z-axis drive to ensure precise positioning and accurate results. S-250-6 is also able to support up to 3 automatic test probes that have been designed to identify defective chips on wafers. Each automatic test probe is equipped with a high-performance routine programming capability to ensure accurate testing results. SIGNATONE S-250-6 also caters to tight mechanical requirements with a maximum of 50,000 probes per hour and even an optional 6-axis robot which can perform automatic homing and test positions for increasing throughput and results accuracy. The advanced data collection system which includes a DataStation (DS), a Windows-based software, and an on-board Prober Manager accumulates test data and stores it on the prober's internal storage area. Overall, S-250-6 is a powerful and versatile prober that offers superior testing capability and results accuracy. Its advanced features and functions makes it the perfect choice for any application that requires accurate test results of small or complex devices.