Used SIGNATONE S-250 #83195 for sale

SIGNATONE S-250 "Deep Level Prober" is a high-performance, fully automated, multi-functional probing and test system for semiconductor device characterization. S-250 is a comprehensive semiconductor wafer prober that can be used for both silicon and compound materials. It features four heads that can accommodate a wide range of microprobe and chuck patterns, allowing for accurate and repeatable contact to the variety of test structures and structures having all possible pin pitch, pitch distances and pitch angles. The prober is capable of positioning and delivering accurate micron-scale measurements in nanometer and micron units, allowing for precise data collection and analysis. It also supports precise electrical evaluation up to 10GHz. It comes with a high-resolution 8-inch color touchscreen enabling flexible operation, real-time control, and precise plotting of data. The prober has four heads equipped with pogo-pins, probes, and cake-pads. It is designed to accommodate various head types, adapters, and probes such as conductive probes, laser diodes, and thermal thermal diode. Pogo-pins are used for high-accuracy probing of ULSI and gate array plates while cake-pads are used for wafer probing. The four-head prober enables probing four different sites simultaneously or in any combination. SIGNATONE S-250 provides a wide selection of user-definable probing techniques for generating repeatable data for high-accuracy performance. Its high-power sample heater and cooling system enable efficient sample optimization of diverse application fields. The prober is capable of controlling plans such as temperature ramp rate, dwell time, and pause time to monitor static or dynamic parameter changes in either destructive or non-destructive test designs. The prober is equipped with an intuitive user-friendly operating system to simplify teaching, operation, and debugging. It offers both graphical and text mode programming with integrated automation, controlling, data collection and analysis software. It provides full contour mapping visualization of probing data over wafer boundary and patterns. The data acquisition and analysis functions are enabled by SIGNATONE internal SAW-100 software with integrated scripting and network options. S-250 is a precise semiconductor wafer prober that ensures reliable performance and fast turnaround, while maintaining a high quality output. It represents a perfect fusion of innovative technology designed to provide a precise and controlled performance solution to this critical process.