Used SIGNATONE S-250 #9363245 for sale

SIGNATONE S-250 prober is a solution for a wide variety of probing applications. With its full range of configuration options available in temperature and mechanical components, users can create a unique set up for testing components, wafers and other device samples. Designed for use in a range of applications, S-250 accommodates device samples of up to twelve inches in diameter with its circular probe head design. The table surface is designed to provide a stable, secure base for the prober's operation and has a 12-inch travel range in the X and Y axes to accommodate a variety of devices. Available with a choice of several high-accuracy probes, SIGNATONE S-250 is capable of accommodating industry-standard testing procedures while providing reliable, consistent results. It can also be used with a variety of specialized software packages or can be updated to provide custom functionality. In addition, a sophisticated control system allows users to monitor the testing process in real time. In terms of mechanical components, S-250 has excellent accuracy with +/- 0.8 microns in X and Y motion and +/- 5 microns in Z motion. It also has a maximum linear velocity of 6.5 m/s and a maximum transfer speed of 20 m/s. Furthermore, the prober can be configured with an optional mounting system for larger samples with ranges up to 250mm. SIGNATONE S-250 prober also offers users an optional temperature range of up to 100°C, which is ideal for testing components at higher temperatures. Its pressure management system is also designed for solid operation in the temperature range, with an adjustable, self-dampening pneumatic probe for reliable testing results. All in all, S-250 prober is a reliable, robust solution for a wide variety of testing applications including wafer testing, IC bonding, die testing, and more. With its customizable configuration and optional temperature control, it offers users unparalleled performance and accuracy for critical testing tasks.