Used SIGNATONE S-251-6 #9192011 for sale

SIGNATONE S-251-6 is a prober used for testing the performance of semiconductor components, including wafers, chips, and modules. It can handle probes from TinyTip to large Touch-Down needles with frequent reworking and re-calibration. Its advanced design and features make it one of the most accurate and reliable probing systems available. S-251-6 has features such as adjustable probe pressure, flexible configurations, and software that help optimize every probing operation. The probe pressure allows users to adjust the actual force needed for probing without changing components. This helps maintain accuracy and repeatability and is especially helpful when testing small products with tiny tips. The flexible configurations can be set for different types of applications, including multiple site probing and even a combination of needle and clamp work. This allows for greater versatility in testing various components and products. SIGNATONE S-251-6 also offers advanced software features such as work offset memory, multiple monitor viewing, and a Virtual Calibration Option. The work offset memory allows users to store probe setup information for future use, reducing labor and cost. Multiple monitor viewing allows for simultaneous operation of multiple probes from one monitoring station. The Virtual Calibration Option allows users to conduct automated calibration checks without having to use a manual setup tool or manually calculating probe height corrections. S-251-6 also comes with a variety of other features, including alarm log and multiple tasking capabilities. The alarm log allows users to check what type of alarms are generated in an automated process. The multiple tasking capabilities enable users to run up to four different tasks simultaneously, increasing efficiency and production throughput. SIGNATONE S-251-6 is one of the most cost-effective and advanced probers available today. With features such as adjustable probe pressure, flexible configurations, advanced software, alarm log, and multiple tasking capabilities, it can help optimize any semiconductor testing process. S-251-6 is an invaluable tool for improving production yield and for increasing efficiency in the manufacturing process.