Used SIGNATONE S-301-4 #9123947 for sale

SIGNATONE S-301-4 is a high-precision semiconductor prober technology designed for use in advanced testing and characterization applications for a variety of high-speed components. This prober has a low-profile design which incorporates advanced features such as vacuum actuated plunger tips, fast-positioning and data encryption systems. The using a combination of coordinate-measuring machines, manual microprobing operations, and pneumatically driven systems, the prober is capable of ultra-precise testing of electronic components and assemblies. S-301-4 features a unique vacuum actuated plunger tip equipment which greatly enhances the accuracy and speed of testing. This system uses a pneumatically driven plunger tip that is precisely controlled by advanced electronic control systems. This precision unit ensures that the device being tested is not damaged or otherwise adversely affected by the testing. The machine is also capable of providing position control and data encryption systems which help to ensure the accuracy and security of the test results. The prober's ultra-precise capabilities also extend to the microprobing operations. SIGNATONE S-301-4 has a three-dimensional moving and positioning stage which can be programmed to move and adjust itself precisely according to the parameters of the components being tested. This feature allows for faster and more accurate testing. Additionally, the tool also incorporates a Multi-Channel Operation (MCO) which provides the user with the ability to simultaneously test multiple components for greater accuracy. The prober is also capable of providing advanced temperature control systems that automatically adjust the temperature of the device being tested. This is useful in order to prevent thermal damage to the components during testing. The asset also includes software for data analysis, which allows the user to quickly and easily review the data and analyze it for greater accuracy. Overall, S-301-4 is a highly advanced prober which provides accurate and reliable testing and characterization of a variety of high-speed components. Its features and capabilities allow it to meet the stringent requirements of many advanced testing and characterization applications.