Used SIGNATONE S-301-6 #9359243 for sale

SIGNATONE S-301-6 prober is a highly precise and advanced wafer probing equipment designed for high-speed, fine pitch, and reliable wafer probing in research, development, and production. It is ideal for testing semiconductor devices such as MEMs, MEMC, SOI, and CMOS devices. The system is equipped with a 6-axis calibration unit, allowing for automated and accurate alignment, indexing, pitch measurement, and pitch control. The 6-axis machine is powered by a high-speed motorized translation stage and allows for the use of up to sixteen adjustable probe needles. The probe needles can be used to measure both vertical and lateral electrical and optical parameters. The prober is also outfitted with an auto-focus camera that uses an LED based light source for automated wafer alignment and automatic wafer handling. A high-resolution camera and vision tool ensure accurate and repeatable probing. The asset features a user-friendly message-based interface let's the user give commands for each sequence on the prober. The user can also create preferences and profiles for repeat measurements. S-301-6 prober provides accurate, repeatable measurements and fast manipulation of wafers. It is fully compatible with various popular Auto-Probe and Scanning Probing Machines (SPM). It is designed for compatibility to the IEEE Signal Probing Standard (IEEE 1587.1) and is compatible with many different tips. The 4-in-1 probe station allows for 4 probes to be used simultaneously and can support probing up to 6-inch wafer size. The probe station utilizes multiple adjustable probe tips for optimal contact and features a built-in heat exchanger for heat dissipation. The model also features an adjustable UV Well Plate holder that can accommodate up to 24 wells and is designed for use with standard UV cuvettes. Additionally, the integrated wafer chuck and tray provides a secure platform for automated wafer placement and large wafer equipment testing. The advanced and precise prober can be used to test various parameters such as short resistance, gate leakage and on-state current, power leakages, resistance-capacitance values, and threshold voltages. The system also offers a wide range of frequency measurements such as scattering parameters and Time Domain Reflectometry (TDR) measurements. SIGNATONE S-301-6 prober has become a reliable and trusted tool for measuring and testing various semiconductor components. The comprehensive set of features make it an ideal choice for testing and measuring in research, development, and production. The ease of use, high accuracy and repeatability, and wide range of features allow for quicker and more precise testing of components.