Used SPEA 4020 #9218788 for sale
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ID: 9218788
Vintage: 2014
Flying probe tester
Working hours: Less than 100
Manual loading
(4) Probes
Internal graphic printer: 24 lines / sec
USB
(3) Diagnostic kit base for 4020
ICT Instruments unit
Dual 4Q DC source:
±10V/±100mA
±48V/±100mA
DVM
Counter
AWG
Active guard
(5) Leonardo fly YA execution
Board locking mechanism
Manual clamp
Manual width set by knobs
Local area network connection with RJ45
Flying probe series: Driver & LAN interface
Leonardo suite fly YA-Plus-R2.50
Power supply: 120 V, Single phase
2014 vintage.
SPEA 4020 is a state-of-the-art, stationary prober designed to enable precise and robust probing of substrates in extremely challenging applications. The prober features a flexible modular body that can be tailored for high throughput, multi-site or wafer-level probing. 4020 has a very solid construction. Its baseplate features an optically flat granite surface for optimal imaging and environmental stability. The collection of precision slides used for substrate manipulation are engineered for a very wide range of substrates with large variations of topology and tilt. The sub-micron accuracy of the slides ensures exceptional wafer alignment stability and repeatability. The prober is powered by a series of touch-response motors, designed with speed, accuracy, and environmental tolerance in mind. The motor range offers speeds up to 0.07 ㎜/s, while its single-axis stepping motor provides up to 170 micron accuracy. The modular design of the motor drive allows for multiple drive modes, allowing it to be adapted to a variety of substrate manipulation tasks. The prober has an advanced automation system that allows independent and simultaneous control over all axes, as well as the allocation of different motor types to each axis. It can be programmed manually with a graphical user interface, or by connecting it to external programming interfaces, such as RS-232, Ethernet, or Ethernet/Modbus. This interface allows for easy setup and error recovery, making it ideal for complex and precise prober applications. SPEA 4020 is equipped with a wide selection of customizable electronic modules for application flexibility. Its modular interface architecture supports several different types of prober electronics, allowing different functions to be integrated on the same prober platform. It is also able to interface with different microscope types, for imaging and for measurement of electrical parameters. In terms of compatibility, 4020 is built to work with a wide range of testing and measurement technologies, including SEMI standardprobewafers, E-Beam, Z-Tilt, Wafer Gap, Wafer Shifting, and XY-Tilt. It is compatible with a variety of robotic systems, such as Pulser, MCD, UAS, Frame, AOI, and Pick & Place. SPEA 4020 is designed for extreme reliability and durability. All components, motors, and electronics, have undergone extensive testing for optimal performance under varied environmental conditions. The prober is built for continuous use and capable of running 24/7 with maximum throughput. Finally, the prober is fully compatible with different types of adapters, making it easy to up- or down-scale the system to meet a wide variety of substrate sizes. In conclusion, 4020 is a powerful, reliable prober that has been designed to deliver exceptional results in complex and demanding applications.
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