Used SPEA 4020S2 #293669613 for sale

SPEA 4020S2 prober is an advanced probing device specifically designed for high-precision wafer testing and analysis. The prober's efficient and reliable probing technology allows for precise, repeatable testing of delicate devices and contact points that require fine probing resolution. The prober has a Heidenhain-based real-time controller, with which it is able to move quickly and accurately in three-dimensions to access device pins and perform contact and electrical testing. The prober incorporates a highly reliable stage position and direction encoders, which enable repeatable probing and positioning accuracy. The stage's X, Y, and Z axes range from 3.68in/sec to 1.1in/sec for a maximum velocity. The made-to-order positioning repeatability is ±25 μm for X,Y,Z axes and this allows for highly accurate wafer alignment and positioning as wafers are probed. 4020S2 is designed with advanced vision recognition capabilities with which it is able to accurately identify test circuit details. It's powerful process-oriented operating equipment is designed to execute all user commands and instructions during the probing process. The system comes with an 18 in. LCD display monitor touch-panel that permits the user to input and monitor data in real-time. The prober features a multi-size wafer handling unit which allows for use of wafers ranging from small samples to large wafers up to 450mm. It's dynamic programmable memory machine allows for storage of up to 10k wafer data sets. SPEA 4020S2 possesses high-end electrical test instrumentation with which testing is facilitated with ultimate accuracy within a range of 0.1µA to 25mA. An additional thermal analysis tool supplies the device with controlled temperature, ranging from -10°C to 70°C. Overall, 4020S2 is a complete, high-precision prober that is fully capable of executing difficult tasks. It is extremely accurate, fast and repeatable. It may be used in numerous applications and its highly functional design ensures optimal wafer testing and analysis.