Used SPEA 4030 #9252475 for sale

SPEA 4030 is an advanced prober designed for high precision probing of semiconductor devices. It is a fully automatic, high-speed prober providing exceptional precision with the ability to measure features down to 0.1 µm on wafers of up to 12 inches diameter. 4030 utilizes a new optical interferometry probing system (OIP) with the ability to adapt to changing wafer sizes, offer up to 15 microns of vertical travel and also offers a repeatability of ±0.5µm. The probe is also designed with an offset capability of ±2.5µm to accommodate the latest generation of large and small device pads. The automated prober is equipped with a motorized XY stage which is capable of moving up to 1mm/sec with an accuracy of ±2.5µm. The L-shaped die map system allows a high degree of precision in locating wafers for probing, with an accuracy of ±0.5µm. In order to ensure the highest-level of accuracy, SPEA 4030 comes with a variety of advanced features, including automated pressure compensation, variable speed adjustment and wireless design. The automated pressure compensation ensures an even force distribution across the wafer for optimal results. Moreover, the ability of the prober to move between different positions can also be customised with high-precision control. This allows for the fine-tuning of wafer locations along the entire process. Like most precision probers, 4030 also comes with an analysis station, which provides data that can help identify and eliminate errors in testing and measurement. This ensures that the prober can be used for measuring even the most complex of devices. SPEA 4030 is a highly reliable and cost-effective solution for precision probing. With its advanced features and reliability, it has become an essential tool for many labs working in the semiconductor industry.