Used SPEA 4040 Series 4 #9215180 for sale

SPEA 4040 Series 4 Prober is a reliable testing and probing platform for semiconductor manufacturers. It is designed to provide repeatable and high-accuracy test results with superior throughput. The prober is equipped with a 4-axis wafer handling system that supports fast loading and unloading of wafers, as well as precise centering and alignment. It also comes with a range of different probes, including multi-probes, single and dual needle probes, and joint-probes. The prober offers a high degree of flexibility and is designed to accommodate different sizes of wafers from 6 to 9 inches in diameter. In addition, it is capable of performing both contact type testing and non-contact type testing, such as capacitance-voltage measurements, current-voltage testing, material electrical property measurements, etc. It is also designed for efficient operation by optimizing testing times, such as through automatic pad compensation. 4040 Series 4 Prober is designed for a wide range of semiconductor test applications and has a robust software package with a user-friendly graphical interface. It offers advanced testing and manipulation capabilities such as parallel application of multiple probes and test patterns, automated optimization of test conditions, and fast data analysis. In terms of accuracy, the prober offers a highly accurate measurement system with linearity and repeatability features. Its measurement accuracy is reported to be in the range of +/- 0.001 inch. It also features a removable head-plate design for convenient replacement and an optional wafer chuck that can be adjusted to accommodate various wafer thicknesses. To ensure safety during operation, the prober is equipped with various sensor systems for detecting faults, misplacement and other operation-related errors. Additionally, the software suite provides software-based detection of unreasonable motion trajectories and error signals. Overall, SPEA 4040 Series 4 Prober is a reliable and versatile tool designed to deliver repeatable and accurate results, along with a high throughput. It is an ideal choice for a variety of semiconductor test applications.