Used SPEA 4040 #293662157 for sale

SPEA 4040 prober is a fully automated testing equipment designed for dedicated engineers testing various packaged-wafer components. It is capable of performing automated probing, analysis and post-probing processes. The automated probing system features a variety of high-precision probing cards for different types of test operations. The card is designed to reduce the risk of thermal damage and oxidation and provides accurate and reliable test results. The card is equipped with high-speed servo-driven turntables for bidirectional testing. It also has a quick response and smooth linear movement ensuring accuracy and repeatability. 4040 prober also features a multifunction tooling unit which includes a tool changer for quick and easy changeover of probes, a z-axis stepper motor and a rotary knob for precise probe adjustment. It also has a robot-assisted probe assembly and a dynamic driving method that allows for an extensive working area. The fully automated control machine provides customizable recipes for quick setup and provides real-time monitoring of test results and tool parameters. SPEA 4040 prober can be used for a variety of tasks ranging from wafer and chip sorting to high-precision testing and probing. It is capable of performing automatic sorting of packages, measuring and sorting parameters such as pitch, size, distance and area. It can also be used for insulation testing, leakage testing, burn-in testing and on-wafer testing. 4040 prober features a four-axis CCD camera that allows for camera-based metrology and vision inspection. SPEA 4040 prober is equipped with a built-in graphical user interface that allows users to quickly review, program and monitor their test operations. The graphical user interface provides users with a variety of customization options and allows for easy viewing of test results. The prober also features several safety features such as a fail-safe fan asset, voltage and temperature sensors, and automatic fault protection. In short, 4040 prober is a reliable and robust model designed for automation and enhanced precision. It is well-suited for a variety of test applications in the reliable testing of wafer-graded components. The prober features a highly customizable out-of-the-box equipment that ensures accuracy and repeatability and can easily be integrated with other systems. Its high-precision and multifunctional tools and features make it a great choice for engineers looking for dedicated testing solutions.