Used SPEA 4040 #293670030 for sale

Manufacturer
SPEA
Model
4040
ID: 293670030
Vintage: 2001
Flying probe tester 2001 vintage.
SPEA 4040 is a prober designed for probing microstructures including small wafers and ultra-micro structures such as MEMS and Nano-electronic structures. 4040 is a versatile and accurate prober with a wide range of capabilities. It can handle wafers up to 200mm in diameter with a maximum thickness of 3mm. The prober can be programmed to perform a variety of testing functions such as electrical measurements and data collection. The prober is operated using a sophisticated software package that allows for automated testing and data collection. The software can be customized to meet specific measurement and data collection requirements. The software also has built-in safety features that ensure the prober is operated safely and prevents any potential damage to the tested microstructures. SPEA 4040 is equipped with an advanced high-resolution vision system that enables accurate and repeatable measurements of the microstructures. The vision system includes several features such as wafer mapping and warping, 3D measurement and imaging, and automated alignment. The prober has 4 or 5 axes of movement depending on the configuration. Each axis is driven by a motor and is computer controlled. This allows for accurate and repeatable positioning of the microstructures for testing. The prober is equipped with a special probe tip that enables the prober to access difficult to reach areas of the microstructures. The probe tip can also be exchanged for a variety of alternative probes to suit different wafer technologies. 4040 is also designed for maximum reliability and long service life. The prober is built using quality components and is designed to meet demanding operational requirements. It can be programmed to run a variety of tests in parallel with reduced set-up and measuring time. The prober is also designed to maintain accuracy over the entire course of its operation. SPEA 4040 is an advanced prober designed for testing microstructures. It features an advanced vision system, automated testing, and a variety of probing techniques. It is reliable and designed for long service life. 4040 is an ideal solution for testing microstructures in a variety of wafer technologies.
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