Used SPEA 4040 #293807496 for sale

SPEA 4040 is a state-of-the-art prober designed for semiconductor wafer testing. 4040 prober has advanced tip alignment and robotic handling capabilities, making it an ideal choice for high-end wafer testing applications. The prober provides fast and accurate positioning, with repeatability up to ±0.02μm, making it a great choice for high-yield yield probing applications. The prober is available in three models - standard, high-speed and multi-function - which offer a variety of features and capabilities. The standard model has a fully integrated independent station, which can be used for automatic die loading and unloading, as well as batch probing. Additionally, the standard model includes a patented three-wire test module, providing complete flexibility during batch probing. The high-speed model includes dual-zone operation, providing quicker throughput and shorter cycle time. This model also has a high-precision positioning system, with repeatability up to ± 0.002 μm. Similarly, the multi-function model provides an integrated EGA and automatic nozzle calibration system, enabling efficient data collection. Furthermore, the prober can be operated in manual, semi-automatic and automatic modes, improving processing speed and accuracy. SPEA 4040 also supports a variety of substrates and probing tips, making it highly versatile. It comes with a list of compatible wafer types and diameters, as well as compatible probes and probe cards, enabling a wide range of specific wafer probing applications. The prober is equipped with intelligent sensors, which enable high-precision operation, while additional features - such as an adjustable offset and speed control - provide easy calibration and adjustment. Moreover, the prober comes with an intuitive user interface, allowing users to access and control the probe's functions directly. In summary, 4040 prober is a reliable and efficient prober, offering versatile features and capabilities for wafer testing applications. With its advanced tip alignment and robot handling, this prober ensures fast and accurate positioning, making it ideal for high-precision probing and data collection. Furthermore, its compatibility with various substrates and probing tips, as well as its intuitive user interface, ensure that SPEA 4040 is a great choice for any wafer testing application.