Used SPEA 4040 #293816160 for sale
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SPEA 4040 is an advanced probe-launching equipment designed for highly accurate, high-volume inspection and testing in semiconductor and electronics manufacturing. Developed by SPEA, 4040 supports a wide range of probing technologies, including thermal, electrical, acoustic, and optical probing. The system has been designed to handle the most demanding high-volume test requirements, reliably and accurately. SPEA 4040 operates on a modular design platform, with four distinct axes of motion. The linear x-axis moves the probing unit horizontally across the device-under-test (DUT), while the z-axis controls the vertical movement of the probing machine, as well as the assembly of the device interconnects. The two angular axes-rotary x-axis and y-axis-allow for precise needle positioning and alignment. An integrated robotic handling tool is also included to facilitate efficient testing by eliminating the need for manual loading and unloading of DUTs. The probe design of 4040 asset is highly precise, ensuring reliable inspection and testing of microscopic semiconductor devices and other components. The needle-based IO contact model provides maximum accuracy by self-aligning the needle tip with the device's contact pad. Additionally, the equipment employs a precise internal calibration algorithm based on a fast parallel pulse for precise integrated circuit measurements. The probe-launching system incorporates a precise, multi-level vibration control unit to further enhance the accuracy of measurements. The machine captures data from each probe launch and automatically calibrates its positioning for best results. Additionally, it has an intuitive user interface with a virtual command line interface (CLI) for fast and accurate setup and operation. In terms of safety, SPEA 4040 is compliant with UL, IEC, and CE standards, providing safe operation and stable operation in any environment. Also, an integrated laser pointer provides easy visual alignment for accurate probe placement. Furthermore, the advanced platform is designed to handle highly complex device interconnects, ensuring reliable data transfer and accurate test results. 4040 offers a solid foundation for automating high-volume, high-accuracy testing. With its multiple axes of motion, precise probing mechanisms, and integrated robotic handling tool, the asset is an ideal solution for inspecting and testing complex, microscopic semiconductor devices and electronics.
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