Used SPEA 4040 #293824982 for sale

SPEA 4040 is a prober designed for inspecting Integrated Circuits at wafers, boards, and die levels. It has a large number of features that make it an ideal choice for a wide range of applications. 4040 comes with a large field of view and a measuring range of up to 800µm. It has an extensive working range of X, Y, tanθ and Z stages that offer a wide range of measurement capabilities. It also features a very sensitive CCD camera that can detect defects on the surface of wafers, boards, and die. Furthermore, the prober can accurately and quickly measure even microscopic parameters such as linear deviation, surface profile, and cross sectional area. The prober offers strong contact force control thanks to the use of electronic, servo-driven stages. This is especially useful for making sure that the contact force is maintained throughout the inspection process. Moreover, the tool is also able to do an automated calibration and system calibration. This ensures accuracy and reliability in the results. Another feature that makes SPEA 4040 stand out is the customizable user interface. The prober can be operated through the computer-based interface without requiring any additional custom programming. On top of that, the intuitive touchscreen makes it easy to operate the prober. In addition, this prober can be integrated with other test equipment, such as optical microscopes, to improve its functionality. In conclusion, 4040 prober is a highly useful, precise, and reliable prober ideal for a wide range of applications. It offers an expansive field of view, extensive measuring range, a sensitive CCD camera, strong contact force control, an automated calibration and system calibration, and customizable user interface. All these features make SPEA 4040 an ideal choice for precision inspection of integrated circuits.