Used SPEA 4040 #9122143 for sale

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Manufacturer
SPEA
Model
4040
ID: 9122143
Vintage: 2000
Flying probe tester Computer Windows XP SPEA Software disks 2000 vintage.
SPEA 4040 Prober is a contact-based testing tool used for probing in various applications, such as semiconductor and microelectronics testing. It is widely used in circuit board and semiconductor package testing, as well as for probing in high-density interconnects (HDIs) and other specialized products. 4040 is an automatic, high-precision prober that features a high precision positioning equipment, dual-axis motion control, and a programmable scanning system. It can support up to 935 probes on a single job, allowing for fast and accurate testing of multiple probes. The prober also offers adjustable tool parameters, adjustable probe positions, and flexible interfacing. SPEA 4040 Prober is designed for precision probing applications. It's capable of testing multiple probes at the same time, as well as individual probes. The tool has a dual-axis motion control unit, allowing for a variety of probing angles and vertical (XY) and horizontal (R) movements. The prober can handle high-density interconnects, devices like chiplets, and pin grids on circuit boards. The tool is also equipped with several unique features and technologies that make it one of the most advanced probers on the market. Features include a parallel high-speed scanning machine, contactless active pressure sensors, and a high-resolution image scanner. The prober is also capable of automatically adjusting the speed of the motions as needed, reducing the time required for a job. 4040 Prober is built for accuracy and speed. It's designed using the latest technology, which allows for a high level of precision and reliability. Additionally, it is capable of quick switching between several probes, and it is capable of automatically recognizing the shape of probes and their alignment. SPEA 4040 is ideal for applications requiring accurate contact and probing images. 4040 is an advanced prober designed for precision contact-based testing. It is an excellent choice for dealing with high-density interconnects, chip packages, and pin grids on circuit boards. The tool offers adjustable tool parameters and programmability, is capable of scanning multiple probes at once, and is equipped with features to improve accuracy and speed. It is a reliable testing tool, suitable for a variety of applications.
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